International Journals

* denotes equal contribution, † denotes corresponding author

• Hyeong Gu Lim, Jaeyoen Jang, Jongkwan Choi, Kyeong Hui Kim, and Chang Ouk Kim†, Fine-tuning double exponentially weighted moving average run-to-run process control method for chemical mechanical polishing using autoencoder, To appear in Expert Systems, 2026
• Daeyeol Yang, Jaeyeon Jang†, and Chang Ouk Kim†, Classifying mixed-defect from single-defect training in imbalanced wafer maps via diffusion and attention, Expert Systems with Applications, 299, B, 130127, 2026.
• Jaeyeon Jang†, Diego Klabjan, Han Liu, Nital S. Patel, Xiuqi Li, Balakrishnan Ananthanarayanan, Husam Dauod, and Tzung-Han Juang, Scalable multi-agent reinforcement learning for factory-wide dynamic scheduling in semiconductor manufacturing, Engineering Applications of Artificial Intelligence, 161, B, 112168, 2025.
• Jaeyeon Jang†, Young-Ik Kim, and Hyeonseong Lee, Adaptive teaching with shared classifier for knowledge distillation, Neurocomputing, 655, 131343, 2025.
• Sungkyu Jung, Jaeyeon Jang†, and Chang Ouk Kim†, A lightweight two-step detection method for real-time small UAV detection, IEEE Access, 13, 128771-128788, 2025.
• Yu Gyeong Ji*, In Ho Kim*, Minjeong Shin, Gyeong Taek Lee†, and Jaeyeon Jang†, Advanced virtual metrology using distribution alignment loss for practical quality control, International Journal of Production Research, 63(23), 9051-9069, 2025.
• Jaeyeon Jang†, Diego Klabjan, Han Liu, Nital S. Patel, Xiuqi Li, Balakrishnan Ananthanarayanan, Husam Dauod, and Tzung-Han Juang, Learning multiple coordinated agents under directed acyclic graph constraints, Expert Systems with Applications, 283, 127744, 2025.
• Jaeyeon Jang and Chang Ouk Kim†, Teacher-explorer-student learning: A novel learning method for open set recognition, IEEE Transactions on Neural Networks and Learning Systems, 36(1), 767-780, 2025.
• Soonjae Kwon, Jaeyeon Jang, and Chang Ouk Kim†, Credit scoring using multi-task Siamese neural network for improving prediction performance and stability, Expert Systems with Applications, 259, 125327, 2025.
• Jaeyeon Jang†, Synthetic unknown class learning for learning unknowns, Pattern Recognition, 153, 110560, 2024.
• Jaeyeon Jang and Chang Ouk Kim†, Collective decision of one-vs-rest networks for open set recognition, IEEE Transactions on Neural Networks and Learning Systems, 35(2), 2327-2338, 2024.
• Seung Ryeong Baek and Jaeyeon Jang†, A two-stage semi-supervised object detection method for SAR images with missing labels based on meta pseudo-labels, Expert Systems with Applications, 236, 121405, 2024.
• Ha Jun Hwang, Jaeyeon Jang, Jongkwan Choi, Jung Ho Bae, Sung Ho Kim, and Chang Ouk Kim†, Stepwise Soft Actor-Critic for UAV Autonomous Flight Control, Drones, 7(9), 549, 2023.
• GyeongTaek Lee, KangJin Kim, and Jaeyeon Jang†, Real-time path planning of controllable UAV by subgoals using goal-conditioned reinforcement learning, Applied Soft Computing, 146, 110660, 2023.
• Hyeong Gu Lim, Jaeyeon Jang, Byung Kook Ju, Jae Woo Ko, and Chang Ouk Kim†, A test vector selection method based on machine learning for efficient presilicon verification, Expert Systems with Applications, 224, 120056, 2023.
• Jaeyeon Jang and Gyeong Taek Lee†, Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model, Expert Systems with Applications, 215, 119363, 2023.
• Gyeong Taek Lee, HyeongGu Lim, and Jaeyeon Jang†, Sequential residual learning for multistep processes in semiconductor manufacturing, IEEE Transactions on Semiconductor Manufacturing, 36(1), 37-44, 2023.
• Jaeyeon Jang†, A deep learning-based conditional system health index method to reduce the uncertainty of remaining useful life prediction, Soft Computing, 27, 3641-3654, 2023.
• Jaeyeon Jang and Chang Ouk Kim†, Siamese network-based health representation learning and reference-based robust remaining useful life prediction, IEEE Transactions on Industrial Informatics, 18(8), 5264-5274, 2022.
• Jaeyeon Jang and Chang Ouk Kim†, Unstructured borderline self-organizing map: learning highly imbalanced, high-dimensional datasets for fault detection, Expert Systems with Applications, 188, 116028, 2022.
• Sinyoung Kim, Jaeyeon Jang, and Chang Ouk Kim†, A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks, Journal of Intelligent Manufacturing, 32, 2267–2280, 2021.
• Seyoung Park, Jaeyeon Jang, and Chang Ouk Kim†, Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels, Journal of Intelligent Manufacturing, 32, 251–263, 2021.
• Jaeyeon Jang, Minkyung Seo, and Chang Ouk Kim†, Support weighted ensemble model for open set recognition of wafer map defects, IEEE Transactions on Semiconductor Manufacturing, 33(4), 635-643. 2020.
• Jaeyeon Jang and Byung Do Chung†, Aggregate production planning considering implementation error: A robust optimization approach using bi-level particle swarm optimization, Computers & Industrial Engineering, 142, 106367, 2020.
• Jaeyeon Jang, Byung Wook Min, and Chang Ouk Kim†, Denoised residual trace analysis for monitoring semiconductor process faults, IEEE Transactions on Semiconductor Manufacturing, 32(3), 293-301, 2019.
• Jaeyeon Jang, Hyui Geon Yoon, Jeong Cheol Kim, and Chang Ouk Kim†, Adaptive weapon-to-target assignment model based on the real-time prediction of hit probability, IEEE Access, 7, 72210-72220, 2019.
• Jueun Kwak, Ki Bum Lee, Jaeyeon Jang, Kyong Soo Chang, and Chang Ouk Kim†, Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques, Journal of Intelligent Manufacturing, 30(3), 1047-1055, 2019.
• Seokgi Lee†, Byung Do Chung, Hyun Woo Jeon, and Jaeyeon Jang, A dynamic control approach for energy-efficient production scheduling on a single machine under time-varying electricity pricing, Journal of Cleaner Production, 165(1), 552-563, 2017.